Advances in X-ray Analysis Vol. 46

A HIGH-TEMPERATURE POWDER DIFFRACTION FURNACE M.D. Dolan, S. Zdzieszynski, S.T. Misture
A NEW SMALL ANGLE X-RAY SCATTERING TECHNIQUE FOR DETERMINING NANO-SCALE PORE/PARTICLE SIZE DISTRIBUTIONS IN THIN FILM Y. Ito, K. Omote, J. Harada
ACCURATE QUANTIFICATION OF RADIOACTIVE MATERIALS BY X-RAY FLUORESCENCE: GALLIUM IN PLUTONIUM METAL C.G. Worley
ANALYSIS OF GEOLOGIC MATERIALS USING RIETVELD QUANTITATIVE X-RAY DIFFRACTION R.M. Gonzalez, T.E. Edwards, T.D. Lorbiecke, R.S. Winburn, J.R. Webster
ANALYSIS OF THE SURFACE MORPHOLOGY OF CVD-GROWN DIAMOND FILMS WITH X-RAY DIFFRACTION M.J. Fransen, J. te Nijenhuis, J.H.A. Vasterink, R.L. Stolk, J.J. Schermer
ANISOTROPIC STRAIN-LIKE LINE BROADENING DUE TO COMPOSITION VARIATIONS A. Leineweber, E.J. Mittemeijer
ANNEALING STUDIES OF PURE AND ALLOYED TANTALUM EMPLOYING ROCKING CURVES D.W. Richards, M.P. Kramer, J.W. House, R.J. De Angelis
APPLICATION OF SYNCHROTRON EDXRD STRAIN PROFILING IN SHOT PEENED MATERIALS I. Zakharchenko, Y. Gulak, Z. Zhong, M. Croft, T. Tsakalakos
APPLICATION OF THE BACKSCATTER FUNDAMENTAL PARAMETER METHOD WITH SIMULTANEOUS EXCITATION BY 55FE AND 109CD RADIOISOTOPE SOURCES D. Wegrzynek, A. Markowicz, E. Chinea-Cano, S. Bamford, P.J. Potts
APPLICATIONS OF X-RAY DIFFRACTION IN THE IMAGING INDUSTRY T.N. Blanton
CALIBRATION OF DIFFRACTOMETERS II: INTERNAL CONSISTENCY AND THE BALANCE G. Berti, M. D'Acunto, U. Bartoli, F. De Marco
CHARACTERIZATION OF THE SOLIDS WASTE IN THE HANFORD WASTE TANKS USING A COMBINATION OF XRD, SEM AND PLM R.W. Warrant, G.A. Cooke
COMPARISON BETWEEN CONVENTIONAL AND TWO-DIMENSIONAL XRD B.B. He, U. Preckwinkel, K.L. Smith
CRYSTAL STRUCTURE DETERMINATIONS OF THREE-LAYER AURIVILLIUS CERAMICS USING A NEW PARALLEL BEAM X-RAY POWDER DIFFRACTOMETER M.S. Haluska, S. Speakman, S.T. Misture
CURVATURE MEASUREMENTS OF STRESSED SURFACE-ACOUSTIC-WAVE FILTERS USING BRAGG ANGLE CONTOUR MAPPING P.M. Adams
DEVELOPMENT OF MEASURING SYSTEM FOR STRESS BY MEANS OF IMAGE PLATE FOR LABORATORY X-RAY EXPERIMENT K. Hiratsuka, T. Sasaki, K. Seki, Y. Hirose
DEVELOPMENT OF WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER USING A MULTI-CAPILLARY X-RAY LENS FOR X-RAY DETECTION
Y. Horino, Y. Mokuno, T. Narusawa, S. Kuwabara, S. Shibata, H. Soejima
DIAGNOSIS OF Ln-DOPED PZT FILMS VIA MICRODIFFRACTION: CORRELATION OF PROPERTIES TO OBSERVED FWHM M.A. Rodriguez, G. Brennecka, B. Tuttle, R. Tissot
EFFECT OF REINFORCEMENT PARTICLE FRACTURE ON THE LOAD PARTITIONING IN AN Al-SiC COMPOSITE H. Choo, B.S. Majumdar, P. Rangaswamy, M.A.M. Bourke
EFFECT OF THE RESIDUAL STRESS ON THE MECHANICAL STRENGTH OF THE THIN FILMS M. Gotoh, S. Takago, T. Sasaki, Y. Hirose
HEAVY MINERAL ANALYSIS OF SANDSTONES BY RIETVELD ANALYSIS J.R. Webster, R.P. Kight, R.S. Winburn, C.A. Cool
HIGH TEMPERATURE ELASTIC STRAIN EVOLUTION IN Si3N4- BASED CERAMICS G.A. Swift, E. U*stu*ndag, B. Clausen, M.A.M. Bourke, H.-T. Lin, C.-W. Li
HIGH TEMPERATURE X-RAY DIFFRACTION STUDY OF REACTION RATES IN CERAMICS M.S. Peterson, C.A. Say, S.A. Speakman, S.T. Misture
HIGH TEMPERATURE X-RAY STUDY OF PHASE EVOLUTION OF Ba2YCu3O6+x FILMS USING THE "BaF2 CONVERSION PROCESS" W. Wong-Ng, I. Levin, M. Vaudin, R. Feenstra, L.P. Cook, J.P. Cline
IDENTIFICATION OF FORGED WORKS OF ART BY PORTABLE EDXRF SPECTROMETRY M. Ardid, J.L. Ferrero, D. Juanes, C. Rolda*n, M. Crespo, M.E. Pernett, M. Marzal, M. Burke, S. Rovira, R. Vives
IN-SITU, IN AIR, HIGH-TEMPERATURE STUDIES OF OXIDE SYSTEMS USING THE THERMAL-IMAGING TECHNIQUE L.F. Siah, J. Schneider, W.M. Kriven
INVESTIGATION OF LOCAL TEXTURES IN EXTRUDED MAGNESIUM BY SYNCHROTRON RADIATION H.-G. Brokmeier, A. Gu*nther, S. Yi, W. Ye, T. Lippmann, U. Garbe
LASER-COMPTON SCATTERING AS A POTENTIAL BRIGHT X-RAY SOURCE K. Chouffani, D. Wells, F. Harmon, G. Lancaster, J. Jones
LATTICE DILATION IN A HYDROGEN CHARGED STEEL G.L. Nash, H. Choo, P. Nash, L.L. Daemen, M.A.M. Bourke
MANAGING BACKGROUND PROFILES USING A NEW X'CELERATOR DETECTOR R.W. Morton, D.E. Simon, J.J. Gislason, S. Taylor
MCSHAPE: A MONTE CARLO CODE FOR SIMULATION OF POLARIZED PHOTON TRANSPORT J.E. Fernandez, V.G. Molinari, M. Bastiano, V. Scot
METHODOLOGY OF SYNCHROTRON EDXRD STRAIN PROFILING I. Zakharchenko, Y. Gulak, Z. Zhong, M. Croft, T. Tsakalakos
MINIMIZATION OF MICROABSORPTION EFFECTS IN COMPLEX MIXTURES B.M. Pederson, R.M. Gonzalez, R.S. Winburn
MONOCAPILLARY OPTICS DEVELOPMENTS AND APPLICATIONS D.H. Bilderback, R. Huang, A. Kazimirov, I.A. Kriksunov, K. Limburg, E. Fontes
PERFORMANCE OF A YB66 DOUBLE-CRYSTAL MONOCHROMATOR FOR DISPERSING SYNCHROTRON RADIATION AT SPRING-8 M. Kitamura, H. Yoshikawa, T. Mochizuki, A.M. Vlaicu, A. Nisawa, N. Yagi, M. Okui, M. Kimura, T. Tanaka, S. Fukushima
POLARIZATION FOR BACKGROUND REDUCTION IN EDXRF - THE TECHNIQUE THAT DOES INDEED WORK R.W. Ryon
PULP AND PAPER PLANT MATERIALS ISSUES ADDRESSED BY X-RAY AND NEUTRON DIFFRACTION METHODS C.R. Hubbard, R.A. Peascoe, J.R. Keiser
REEL-TO-REEL TEXTURE ANALYSIS OF HTS COATED CONDUCTORS USING A MODIFIED GADDS SYSTEM J.L. Reeves, V. Selvamanickam, R.L. Snyder
RENDERING OF CRYSTALLOGRAPHIC ORIENTATIONS, ORIENTATION AND POLE PROBABILITY DENSITY FUNCTIONS H. Schaeben, K.G. van den Boogaart
RESIDUAL STRESS DETERMINATIONS USING PARALLEL BEAM OPTICS T.R. Watkins, O.B. Cavin, J. Bai, J.A. Chediak
RIETVELD ANALYSIS OF COMPLEX MIXTURES. WHAT CAN WE DO? R.S. Winburn
RIETVELD REFINEMENT OF 2-THETA SPLIT RANGES - A METHOD FOR REDUCING ANALYSIS TIME K. Laursen, T. White
SPECTRAL INTERFERENCE IN X-RAY FLUORESCENCE ANALYSIS OF COMMON MATERIALS F.R. Feret, H. Hamouche, Y. Boissonneault
STRESS ANALYSIS USING BREMSSTRAHLUNG RADIATION F.A. Selim, D.P. Wells, J.F. Harmon, J. Kwofie, A.K. Roy, T. White, T. Roney
STRUCTURE OF NANOCRYSTALLINE MATERIALS BY THE ATOMIC PAIR DISTRIBUTION FUNCTION TECHNIQUE V. Petkov
THE INFLUENCE OF SURFACE ROUGHNESS ON THE REFRACTION OF X-RAYS AND ITS EFFECT ON BRAGG PEAK POSITIONS M.H. Ott, D. Lo*he
THE USE OF X-RAY DIFFRACTION MEASUREMENTS TO DETERMINE THE EFECT OF AGING ON RESIDUAL STRESSES IN UNIDIRECTIONAL AND WOVEN GRAPHITE/POLYIMIDE COMPOSITES B. Benedikt, M. Gentz, L. Kumosa, P.K. Predecki, D. Armentrout, M. Kumosa, J.K. Sutter
THERMAL FATIGUE PROPERTIES OF LASER PEENED HOT WORK DIE STEEL (H13) K. Yatsushiro, M. Sano, M. Kuramoto
THREE-DIMENSIONAL MAPPING OF FATIGUE CRACK POSITION VIA A NOVEL X-RAY PHASE CONTRAST APPROACH K. Ignatiev, W.-K. Lee, K. Fezzaa, G.R. Davis, J.C. Elliott, S.R. Stock
TIME-RESOLVED X-RAY DIFFRACTION STUDIES OF THE TEXTURE FORMATION KINETICS IN THE C49-C54 TiSi2 PHASE TRANSFORMATION A.S. O*zcan, K.F. Ludwig, Jr., C. Lavoie, C. Cabral, Jr., J.M.E. Harper
UNDERKARAT JEWELRY: THE PERFECT CRIME? INVESTIGATIONS AND ANALYSIS OF JEWELRY USING XRF D. Kloos
USE OF X-RAYS IN THE UNITED KINGDOM FORENSIC SCIENCE SERVICE D.F. Rendle
VACANCY FORMATION DURING LOW-TEMPERATURE Ag(001) AND Ag(111) HOMOEPITAXY C.E. Botez, K. Li, E. Lu, W.C. Elliott, P.F. Miceli, E. Conrad, P.W. Stephens
VORTEX(TM) - A NEW HIGH PERFORMANCE SILICON DRIFT DETECTOR FOR XRD AND XRF APPLICATIONS S. Barkan, J.S. Iwanczyk, B.E. Patt, L. Feng, C.R. Tull
WAVEGUIDE-RESONANCE MECHANISM FOR X-RAY BEAM PROPAGATION: PHYSICS AND EXPERIMENTAL BACKGROUND V.K. Egorov, E.V. Egorov
X-RAY DIFFRACTION ANALYSIS IN THE FORENSIC SCIENCE: THE LAST RESORT IN MANY CRIMINAL CASES W. Kugler
X-RAY STRESS ANALYSIS OF DAMAGE EVOLUTION IN Ti-SiC UNIDIRECTIONAL FIBER COMPOSITES J.C. Hanan, E. U*stu*ndag, I.J. Beyerlein, G.A. Swift, J.D. Almer, U. Lienert, D.R. Haeffner
ZINC/IRON PHASE TRANSFORMATION STUDIES ON GALVANNEALED STEEL COATINGS BY X-RAY DIFFRACTION S. Wienstro*er, M. Fransen, H. Mittelsta*dt, C. Nazikkol, M. Vo*lker