Advances in X-ray Analysis Vol. 49

3D INTERACTIVE DATA LANGUAGE POLE FIGURE VISUALIZATION C.S. Frazer, M.A. Rodriguez, R.G. Tissot
A NEW AREA DETECTOR FOR HIGH-SPEED AND HIGH-SENSITIVITY X-RAY DIFFRACTION ANALYSIS T. Taguchi
ABNORMAL X-RAY EMISSION FROM INSULATORS BOMBARDED WITH LOW ENERGY IONS M. Song, K. Mitsuishi, M. Takeguchi, K. Furuya, R.C. Birtcher
APPLICATIONS OF X-RAY MICRODIFFRACTION IN THE IMAGING INDUSTRY T.N. Blanton
AVERAGE AND GRAIN SPECIFIC STRAIN OF A COMPOSITE UNDER STRESS USING POLYCHROMATIC MICROBEAM X-RAYS H.A. Bale, J.C. Hanan, N. Tamura, E. �st�ndag
CHARACTER OF THE HIGH-TEMPERATURE STRUCTURAL CHANGES IN CSD2PO4 AND RBD2PO4 W. Bronowska
CHARACTERIZING PROCESS SEMICONDUCTOR THIN FILMS WITH A CONFOCAL MICRO X-RAY FLUORESCENCE MICROSCOPE C.M. Sparks, E.P. Hastings, G.J. Havrilla, M. Beckstead
COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS DETERMINED BY XRD AND EBSD J. Mueller, D. Balzar, R.H. Geiss, D.T. Read, R.R. Keller
CONSIDERATIONS FOR COLLECTING RELIABLE XRD RESIDUAL STRESS DATA ACROSS THE FULL 2THETA RANGE A.C. Vermeulen
CRYSTALLOGRAPHIC CHANGES IN ELECTRICALLY FATIGUED ACTUATORS J. Mueller, D. Balzar, S. Hooker
DATA MINING WITH DIFFERENT TYPES OF X-RAY DATA C.K. Lowe-Ma, A.E. Chen, D. Scholl, C.J. Gilmore, R.J. Thatcher, W. Sverdlik
DETECTION OF VISIBLE AND LATENT FINGERPRINTS BY MICRO-X-RAY FLUORESCENCE C.G. Worley, S.S. Wiltshire, T.C. Miller, G.J. Havrilla, V. Majidi
DETERMINATION OF THE ELEMENT DISTRIBUTION IN SAUROPOD LONG BONES BY MICRO-XRF R. Ferreyro, N. Zoeger, N. Cernohlawek, C. Jokubonis, C. Streli, P. Wobrauschek, M. Sander, A. Pyzalla
DEVELOPMENT OF PLASTIC CERTIFIED REFERENCE MATERIALS FOR XRF ANALYSIS (JSAC 0611-0615) CONTAINING PB, CD, CR; PART I: SAMPLE PREPARATION AND HOMOGENEITY TEST K. Nakano, K. Tsuji, M. Kozaki, K. Kakita, A. Ono, T.Nakamura
DEVELOPMENT THE MICROSTRUCTURE OF SEVERELY-PLASTICALLY DEFORMED MG ALLOY, ZK60 G.M. Stoica, A.E.Payzant, L. Wu, H.H. Liao, J.E. Spruiell, P.K. Liaw
DEVELOPMENTS IN FORMULATION ANALYSES BY POWDER DIFFRACTION ANALYSIS T.G. Fawcett, J. Faber, F. Needham, S.N. Kabekkodu, C.R. Hubbard, J.A. Kaduk
ELECTRIC FIELD INFLUENCE ON EMISSION OF CHARACTERISTIC X-RAY FROM AL2O3 TARGETS BOMBARDED BY SLOW XE+ IONS J.C. Rao, M. Song, K. Mitsuishi, M. Takeguchi, K. Furuya
EXPERIMENTAL STUDY OF X-RAY ENERGY SPECTRUM FORMED BY PLANAR WAVEGUIDE-RESONATOR WITH SPECIFIC ELEMENT COMPOSITION REFLECTORS V.K. Egorov, E.V. Egorov
FACTORS AFFECTING IN-LINE PHASE CONTRAST IMAGING WITH A LABORATORY MICROFOCUS X-RAY SOURCE K.L. Kelly, B.K. Tanner
FULL SPECTRUM CALCULATIONS OF EDXRF SPECTRA W.T. Elam, B. Shen, B. Scruggs, J. Nicolosi
FUNDAMENTAL PARAMETER METHOD USING SCATTERING X-RAYS IN X-RAY FLUORESCENCE ANALYSIS Y. Kataoka, N. Kawahara, S. Hara, Y. Yamada, T. Matsuo, M. Mantler
FUNDAMENTAL PARAMETER PROGRAMS: ALGORITHMS FOR THE DESCRIPTION OF K, L AND M SPECTRA OF X-RAY TUBES H. Ebel
HIGH-RESOLUTION PARALLEL-BEAM POWDER DIFFRACTION MEASUREMENT OF SUB-SURFACE DAMAGE IN ALUMINA-SILICON CARBIDE NANOCOMPOSITE B.K. Tanner, H.Z. Wu, S.G. Roberts
IDENTIFICATION OF PAINTING MATERIALS USED FOR MURAL PAINTINGS BY IMAGE ANALYSIS AND XRF S. Shirono, Y.Hayakawa
INFLUENCE OF GROWTH INTERRUPTION ON THE FORMATION OF SOLID-STATE INTERFACES I. Busch, M. Krumrey, J. St�mpel
IN-SITU OBSERVATION OF CREEP DAMAGE IN AL-AL2O3 MMCS BY SNYCHROTRON X-RAY TOMOGRAPHY A. Pyzalla, B. Camin, B. Lehrer, M. Wichert, A. Koch, K. Zimnik, E. Boller, W. Reimers
INVESTIGATING THE NATURE OF LINE BROADENING IN ELECTROCHEMICALLY DELITHIATED LI1.2MN0.4NI0.3CO0.1O2 P.S. Whitfield, S. Niketic, Y. Le Page, I.J. Davidson
INVESTIGATION OF LATERAL STRUCTURED INTERFACES WITH DXRS AND SPM I. Busch, G. Dai, J. St�mpel
LABORATORY SYSTEM FOR X-RAY NANOTOMOGRAPHY A. Sasov
LOBSTER EYE OPTICS FOR COLLECTING RADIATION OF A LASER-PLASMA SOFT X-RAY SOURCE BASED ON A GAS PUFF TARGET A. Bartnik, H. Fiedorowicz, R. Jarocki, J. Kostecki, R. Rakowski, M. Szczurek, L. P�na, L. �v�da, A. Inneman
MEASUREMENT AND MODELING OF INTERNAL STRESSES AT MICROSCOPIC AND MESOSCOPIC LEVELS USING MICRO RAMAN SPECTROSCOPY AND X-RAY DIFFRACTION B. Benedikt, M. Lewis, P. Rangaswamy
MEASUREMENT OF STRAIN AND LATTICE TILT AT THE MARGINS OF THIN FILM ISLANDS ON SINGLE-CRYSTAL SUBSTRATES BY DOUBLE-CRYSTAL X-RAY TOPOGRAPHY P.M. Adams
MEDICAL X-RAY IMAGING, CURRENT STATUS AND SOME FUTURE CHALLENGES E.L. Ritman
MICROTOMOGRAPHY OF AMORPHOUS METAL DURING THERMO-PLASTIC FOAMING J.C. Hanan, C. Veazey, M.D. Demetriou, F. DeCarlo, S. Thompson
MONTE-CARLO MODELING OF SILICON X-RAY DETECTORS B. Cross, G. Bale, B. Lowe, R. Sareen
MULTI-MODE X-RAY STUDY OF SODIUM AND MAGNESIUM SULFATE ATTACK ON PORTLAND CEMENT PASTE N.N. Naik, A.C. Jupe, S.R. Stock, A.P. Wilkinson, P.L. Lee, K.E. Kurtis
MULTI-SPECTRAL XRF COUNTING: SQUEEZE TWICE AS MUCH INFORMATION FROM YOUR DETECTOR W.K. Warburton, P. Grudberg, J. Harris, G. Roach, B. Cross
NEW OBSERVATIONS ON LIBR RELEASING AGENT LAYER IN FUSION BEADS F. Claisse
OPTIMAL DESIGN OF TRANSMISSION GRATING FOR X-RAY TALBOT INTERFEROMETER W. Yashiro, A. Masada, A. Momose
PARAMETER STUDIES FOR AN OPTIMIZED XRF-DETERMINATION OF PB IN BONE N. Cernohlawek, P. Wobrauschek, C. Streli, N. Zoeger
PHASE IMAGING WITH AN X-RAY TALBOT INTERFEROMETER A. Momose, W. Yashiro, Y. Takeda, Y. Suzuki, T. Hattori
POWDER X-RAY DIFFRACTION DETECTION OF CRYSTALLINE PHASES IN AMORPHOUS PHARMACEUTICALS B.A. Sarsfield, M. Davidovich, S. Desikan, M. Fakes, S. Futernik, J.L. Hilden, J.S. Tan, S. Yin, G. Young, B. Vakkalagadda, K. Volk
QUANTITATIVE ENERGY-DISPERSIVE ELECTRON PROBE X-RAY MICROANALYSIS OF INDIVIDUAL PARTICLES C.-U. Ro
QUANTITATIVE RIETVELD ANALYSIS OF HYDRATED CEMENTITIOUS SYSTEMS L.D. Mitchell, P.S. Whitfield, J.C. Margeson
QUANTITATIVE TRANSPORT PROPERTIES OF GRANULAR MATERIAL CALCULATED FROM X-RAY �CT IMAGES M.A. Knackstedt, C.H. Arns, F. Bauget, A. Sakellariou, T.J. Senden, A.P. Sheppard, R.M. Sok
RESIDUAL STRESS MEASUREMENT OF CEMENTITE PHASE IN PLASTICALLY DEFORMED CARBON STEELS Y. Horimoto, L. Che, M. Gotoh, Y. Hirose
RESIDUAL STRESSES DISTRIBUTION IN GTA SPOT WELDED TI6AL4V DISKS J. Sariel, I. Dahan, R. Reuven, M. Szanto, A. Stern
RIETVELD TEXTURE ANALYSIS BY NEUTRON DIFFRACTION OF HIGHLY ABSORBING MATERIALS H.M. Volz, S.C. Vogel, C.T. Necker, J.A. Roberts, A.C. Lawson, D.J. Williams, L.L. Daemen, L. Lutterotti, J. Pehl
TEMPERATURE DEPENDENCE OF RESIDUAL STRESS IN TITANIUM NITRIDE COATINGS ON HAYNES 188 SUPERALLOY S.H. Ferguson, H.W. King
THERMAL LATTICE EXPANSION IN EPITAXIAL SRTIO3(100) ON SI(100) D.E. McCready, Y. Liang, V. Shutthanandan, C. Wang, S. Thevuthasan
TIME-RESOLVED �-XRF AND ELEMENTAL MAPPING OF BIOLOGICAL MATERIALS K. Tsuji, K. Tsutsumimoto, K. Nakano, K. Tanaka, A. Okhrimovskyy, Y. Konishi, X. Ding
TIME-RESOLVED X-RAY IMAGING IN STUDIES OF ADVANCED ALLOY SOLIDIFICATION PROCESSES R.H. Mathiesen, L. Arnberg
UNTANGLING CATION ORDERING IN COMPLEX LITHIUM BATTERY CATHODE MATERIALS - SIMULTANEOUS REFINEMENT OF X-RAY, NEUTRON AND RESONANT SCATTERING DATA P.S. Whitfield, I.J. Davidson, L.M.D. Cranswick, I.P. Swainson, P.W. Stephens
USE OF THE MONTE CARLO SIMULATION CODE CEARXRF FOR THE EDXRF INVERSE PROBLEM R.P. Gardner, F. Li, W. Guo
X-RAY AND NEUTRON DIFFRACTION OF ERD2 POWDERS & FILMS M.A. Rodriguez, J.F. Browning, C.S. Frazer, R.G. Tissot, S.C. Vogel, D.J. Williams, A. Llobet
X-RAY BACKSCATTER IMAGING: PHOTOGRAPHY THROUGH BARRIERS J. Callerame
X-RAY MICROTOMOGRAPHIC IMAGING AND ANALYSIS FOR BASIC RESEARCH J.H. Dunsmuir, S. Bennett, L. Fareria, A. Mingino, M. Sansone
X-RAY PHYSICS IN PLASTICS: LOW ABSORPTION KEEPS PHOTON IN PLAY J.-C.A. Lee, P.J. Ramadge, B. Hubbard-Nelson, D.I. Feinstein