Advances in X-ray Analysis Vol. 56

ANALYTICAL METHOD FOR OBSERVED POWDER DIFFRACTION INTENSITY DATA BASED ON MAXIMUM LIKELIHOOD ESTIMATION T. Ida, F. Izumi
APPLICATION OF MICRO-XRF FOR NUCLEAR MATERIALS CHARACTERIZATION AND PROBLEM SOLVING C.G. Worley, L. Tandon, P.T. Martinez, D.L. Decker
CHARACTERIZATION OF X-RAY IRRADIATED GRAPHENE OXIDE COATINGS USING X-RAY DIFFRACTION, X-RAY PHOTOELECTRON SPECTROSCOPY, AND ATOMIC FORCE MICROSCOPY T.N. Blanton, D. Majumdar
COMPARING EXISTING MAC TABLES - HINTS TO POSSIBLE DEVELOPMENTS P. Caussin
DESIGN OF AN IN-SITU XRF INSTRUMENT FOR ELEMENTAL DIFFUSION MEASUREMENTS W.T. Elam, T. Grundl, O.X. Leupin, M. Descostes
DETERMINATION OF THE EFFICIENCY OF A SILICON DRIFT DETECTOR (SDD) BY MONTE CARLO SIMULATION A. Rakotondrajoa, G. Buzanich, M. Radtke, U. Reinholz, H. Riesemeier, L. Vincze, R. Raboanary
ELEMENTAL DEPTH PROFILING OF FORENSIC SAMPLES BY CONFOCAL 3D-XRF METHOD S. Emoto, K. Otsuki, K. Nakano, K. Tsuji
FIELD APPLICATIONS OF PXRF FOR CULTURAL HERITAGE DIAGNOSTICS: RAPID IN-FIELD ARCHAEOLOGICAL ANALYSIS IN THE FAYNAN ANCIENT COPPER PRODUCTION ZONE, JORDAN K. Bennallack, L. Hahn, T.E. Levy
HIGH RESOLUTION TRACE ELEMENT DISTRIBUTION AND STRUCTURE OF THE MUSSEL SHELL PERNA VIRIDIS FROM MANILA BAY, PHILIPPINES V.A. Innis-Samson, M. Mizusawa, K. Sakurai
IMPROVEMENT OF THE X-RAY REFLECTIVITY CALCULATIONS ON A MULTILAYERED SURFACE Y. Fujii
METHODS FOR MOUNTING RADIOACTIVE POWDERS FOR XRD ANALYSIS L.N. Squires, R.D. Mariani, T. Hartmann, J.R. Kennedy
MICRO X-RAY BEAM PRODUCED WITH A SINGLE GLASS CAPILLARY FOR XRF ANALYSIS S. Komatani, S. Hirano, T. Aoyama, Y. Yokota, H. Ueda, K. Tsuji
MOXTEKS NEW ULTRA-LITE X-RAY SOURCES: PERFORMACE CHARACTERIZATIONS S. Cornaby, S. Morris, J. Smith, D. Reynolds, K. Kozaczek
MULTI LENGTH SCALE CHARACTERISATION OF AUSTENITE IN TRIP STEELS USING HIGH-ENERGY X-RAY DIFFRACTION R. Blond, E. Jimenez-Melero, L. Zhao, J.P. Wright, E. Brck, S. van der Zwaag, N.H. van Dijk
NANOCRYSTALLINE ZINC OXIDE POWDER FOR X-RAY DIFFRACTION METROLOGY J.P. Cline, J.J. Ritter, D. Black, J.E. Bonevich, A. Henins
PHASE TRANSITION BEHAVIOR OF A PROCESSED THERMAL BATTERY J.J.M. Griego, M.A Rodriguez, D.E. Wesolowski
PROBING LARGE WAVEVECTOR PHONONS AT THE NANOSCALE VIA X-RAY THERMAL DIFFUSE SCATTERING G. Gopalakrishnan, M.V. Holt, K.M. McElhinny, D.A. Czaplewski, P.G. Evans
QUICK X-RAY REFLECTIVITY OF SPHERICAL SAMPLES K. Stoev, K. Sakurai
SELECTED APPLICATIONS OF RIETVELD-XRD ANALYSIS IN THE ALUMINUM INDUSTRY F.R. Feret
SYNTHESIS AND CRYSTALLOGRAPHIC STUDY OF CATION SUBSTITUTED NZP MATERIALS: NA1+XZR2-XMXP3O12 (M=SB, AL, CR AND X=0.1) R. Chourasia, O.P. Shrivastava
THE STRUCTURAL CHARACTERIZATION OF A NEW FORM OF CLENBUTEROL, A WELL KNOWN DECONGESTANT AND BRONCHODILATOR, ALSO USED AS A PERFORMANCE-ENHANCING DRUG. R. Toro, J. Bruno-Colmenrez, G. Daz de Delgado, J.M. Delgado
TILT-A-WHIRL: A TEXTURE ANALYSIS PACKAGE FOR 3D RENDERING OF POLE FIGURES USING MATLAB M.A. Rodriugez, M.R. Pearl, M.H. Van Benthem, J.J.M. Griego, J. Pillars
USE OF THE RIETVELD METHOD FOR DESCRIBING STRUCTURE AND TEXTURE IN XRD DATA OF DOLOMITE [CAMG(CO3)2] AND HYDROMAGNESITE [MG5(CO3)4(OH)2(H2O)4] POWDERS H. Sitepu
X-RAY DIFFRACTION IMAGING FOR PREDICTIVE METROLOGY OF CRACK PROPAGATION IN 450MM DIAMETER SILICON WAFERS B.K. Tanner, J. Wittge, P. Vagovic, T. Baumbach, D. Allen, P.J. McNally, R. Bytheway, D. Jacques, M.C. Fossati, D.K. Bowen, J. Garagorri, M.R. Elizalde, A.N. Danilewsky
XRAY FLUORESCENCE (XRF) ASSISTED, MULTISPECTRAL IMAGING OF HISTORIC DRAWINGS S. Stout, F. Kuester, M. Seracini
XRF ANALYSIS OF HIGH GAIN-ON-IGNITION SAMPLES BY FUSION METHOD USING FUNDAMENTAL PARAMETER METHOD M. Watanabe, H. Inoue, Y. Yamada, M. Feeney, L. Oelofse, Y. Kataoka
XRF SENSITIVITY IMPROVEMENT WITH A NOVEL CAPACITIVE CONCENTRATION CELL C. Bupp, D. Dietrich