Powder Diffraction - Vol. 16 Number 1 - March 2001

Abstracts, Editorials, and International Reports from Powder Diffraction are now available online free of charge.  To view the abstracts with option to purchase articles or login if you have a subscription, please visit Cambridge Journals Online.  For information about subscribing please contact:

Cambridge University Press
100 Brook Hill Drive
West Nyack, NY 10994-2133
Phone: 845-353-7500
Toll free: 800-872-7423
Fax: 845-353-4141
Email: subscriptions_newyork@cambridge.org


  • Giovanni Berti - A method for routine comparison of XRPD measurements (1)
  • Giovanni Berti - Application of diffraction instrumental monitoring to the analysis of diffraction patterns from a Round Robin project on KCl (6)
  • Richard W. Schaeffer, Monica Ardelean - Powder X-ray diffraction of oriented and intercalated lead iodide (16)
  • Sampath S. Iyengar, Neelima V. Phadnis, and Raj Suryanarayanan - Quantitative analyses of complex pharmaceutical mixtures by the Rietveld method (20)
  • Maria Cristina Comunian Ferraz, Heitor Cury Basso, and Yvonne P. Mascarenhas - Study of YBa2Cu3O7-x reaction kinetics by Rietveld method (25)


  • W. Paxzkowicz, M. Marczak, A.M. Vorotynov, K.A. Sablina, and G.A. Petrakovskii - Powder diffraction study of LiCu2O2 crystals (30)
  • E. Smit, B. Manoun, S.M.C. Verryn, and D. de Waal - Improvement of X-ray powder diffraction patterns of the spin transition polymer [Fe(Htrz)3](ClO4)2 . 1.85H20 (37)
  • Mattheas Wilhelm, Fank Kubel, and Werner Wruss - XRD investigation of Si-SiC composites with fine SiC microstructure (42)
  • Petr Melnikov, Alexandre Cuin, Pedro P. Corbi, Mauricio Cavicchioli, and Antonio C. Massabni - Powder X-ray characterization of djenkolic acid (46)


  • Regional Reports (48)
  • Calendar of Meetings (50)
  • Short Courses & Workshops (55)
  • Cumulative Author Index (57)