Powder Diffraction - Vol. 20 Number 2 - June 2005

Abstracts, Editorials, and International Reports from Powder Diffraction are now available online free of charge.  To view the abstracts with option to purchase articles or login if you have a subscription, please visit Cambridge Journals Online.  For information about subscribing please contact:

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EDITORIAL

  • Ting C. Huang - Special Issue on Selected Articles from the Proceedings of the 2004 Denver X-ray Conference (79)

RED HOT X-RAYS

  • John B. Parise, Sytle M. Antao, Charles D. Martin, and Wilson Crichton - Diffraction studies of order–disorder at high pressures and temperatures (80)
  • K. F. Kelton and A. K. Gangopadhyay - Getting the hot structures (87)
  • Thomas N. Blanton, Swavek Zdzieszynski, Michael Nicholas, and Scott Misture - In situ high-temperature X-ray diffraction study of phase transformations in silver behenate (94)

XRD CHARACTERIZATION

  • Paul Stutzman - Powder diffraction analysis of hydraulic cements: ASTM Rietveld round-robin results on precision (97)
  • Wen-Ming Chien, Dhanesh Chandra, Jennifer Franklin, Claudia J. Rawn, and Abdel K. Helmy - X-ray diffractometry studies and lattice parameter calculation on KNO3–NH4NO3 solid solutions (101)
  • Michael Herrmann and Harald Fietzek - Investigation of the microstructure of energetic crystals by means of X-ray powder diffraction (105)
  • I. Dragomir-Cernatescu, M. Gheorghe, N. Thadhani, and R. L. Snyder - Dislocation densities and character evolution in copper deformed by rolling under liquid nitrogen from X-ray peak profile analysis (109)

STRAIN/STRESS ANALYSIS

  • C. E. Murray, C. C. Goldsmith, and I. C. Noyan - Spatially transient stress effects in thin films by X-ray diffraction (112)
  • Takayuki Sakakibara and Yoshihiro Sato - Nonlinear theta-sin2  psi cdiagram by shot peening on spring steel (117)
  • M. L. Benson, T. A. Saleh, P. K. Liaw, H. Choo, D.W. Brown, M. R. Daymond, X.-L. Wang, A. D. Stoica, R. A. Buchanan, and D. L. Klarstrom - Fatigue-induced phase formation and its deformation behavior in a cobalt-based superalloy (121)

XRD INSTRUMENTATION AND TECHNIQUES

  • J. F. Woitok and A. Kharchenko - Towards fast reciprocal space mapping (125)
  • P. Sarrazin, D. Blake, S. Feldman, S. Chipera, D. Vaniman, and D. Bish - Field deployment of a portable X-ray diffraction/X-ray flourescence instrument on Mars analog terrain (128)

XRF INSTRUMENTATION AND TECHNIQUES

  • Terrence Jach, John A. Small, and Dale E. Newbury - Improving energy stability in the National Institute of Standards and Technology Microcalorimeter X-ray detector (134)
  • K. Tsuji, T. Emoto, Y. Matsuoka, Y. Miyatake, T. Nagamura, and X. Ding - Micro X-ray flourescence instrument developed in combination with atomic force microscope (137)
  • Hagen Stosnach - Trace element analysis using a benchtop total reflection X-ray fluorescence spectrometer (141)
  • Robin P. Gardner and Weijun Guo - Development of a Monte Carlo—Library Least-Squares code package for the EDXRF inverse problem (146)

XRF CHARACTERIZATION

  • Thomasin C. Miller and George J. Havrilla - Elemental imaging for pharmaceutical tablet formulation analysis by micro X-ray fluorescence (153)
  • N. Zoeger, C. Streli, P. Wobrauschek, C. Jokubonis, G. Pepponi, P. Roschger, S. Bohic, and W. Osterode - Elemental mapping in slices of human brain by SR- µXRF (158)
  • Chris M. Sparks, Patrick Lysaght, and Todd Rhoad - Measurement of the silicon dioxide concentration in hafnium silicate gate dielectrics with a total reflection X-ray fluorescence spectroscopy (161)

DENVER X-RAY CONFERENCE

  • D. Flaherty - 2004 Denver X-ray Conference (165)

Cumulative Author Index (187)