Powder Diffraction - Vol. 21 Number 2 - June 2006

Abstracts, Editorials, and International Reports from Powder Diffraction are now available online free of charge.  To view the abstracts with option to purchase articles or login if you have a subscription, please visit Cambridge Journals Online.  For information about subscribing please contact:

Cambridge University Press
100 Brook Hill Drive
West Nyack, NY 10994-2133
Phone: 845-353-7500
Toll free: 800-872-7423
Fax: 845-353-4141
Email: subscriptions_newyork@cambridge.org

EDITORIAL

  • Ting C. Huang - Special Issue on Selected Articles from the Proceedings of the 2005 Denver X-ray Conference (89)
  • Denver X-ray Organizing Committee - Award for Ting C. Huang (90)

X-RAY DIFFRACTION

  • Thomas N. Blanton - Applications of X-ray microdiffraction in the imaging industry (91)
  • Takeyoshi Taguchi - A new position sensitive area detector for high-speed and high-sensitivity X-ray
    diffraction analysis
    (97)
  • Colleen S. Frazer, Mark A. Rodriguez, and Ralph G. Tissot - Three-dimensional Interactive Data Language pole figure visualization (102)
  • T. G. Fawcett, J. Faber, F. Needham, S. N. Kabekkodu, C. R. Hubbard, and J. A. Kaduk - Developments in formulation analyses by powder diffraction analysis (105)
  • L. D. Mitchell, J. C. Margeson, and P. S. Whitfield - Quantitative Rietveld analysis of hydrated cementitious systems (111)
  • H. M. Volz, S. C. Vogel, C. T. Necker, J. A. Roberts, A. C. Lawson, D. J. Williams, L. L. Daemen, L. Lutterotti,
    and J. Pehl - Rietveld texture analysis by neutron diffraction of highly absorbing materials (114)
  • B. Benedikt, M. Lewis, and P. Rangaswamy - Measurement and modeling of internal stresses at microscopic and mesoscopic levels using micro-Raman spectroscopy and X-ray diffraction (118)
  • I. Busch, J. Stümpel, and M. Krumrey - Influence of growth interruption on the formation of solid-state interfaces (122)

X-RAY FLUORESCENCE AND RELATED TECHNIQUES

  • J. H. Dunsmuir, S. Bennett, L. Fareria, A. Mingino, and M. Sansone - X-ray microtomographic imaging and analysis for basic research (125)
  • Joseph Callerame - X-ray backscatter imaging: Photography through barriers (132)
  • Christopher G. Worley, Sara S. Wiltshire, Thomasin C. Miller, George J. Havrilla, and Vahid Majidi - Detection of visible and latent fingerprints by micro-X-ray fluorescence (136)
  • Chul-Un Ro - Quantitative energy-dispersive electron probe X-ray microanalysis of individual
    particles
    (140)
  • Chris M. Sparks, Elizabeth P. Hastings, George J. Havrilla, and Michael Beckstead - Characterizing process semiconductor thin films with a confocal micro X-ray fluorescence microscope (145)
  • N. Cernohlawek, P. Wobrauschek, C. Streli, and N. Zoeger - Parameter studies for an optimized XRF-determination of Pb in bone (148)
  • W. T. Elam, Bob Shen, Bruce Scruggs, and Joseph Nicolosi - Full spectrum calculations of EDXRF spectra (152)
  • J. C. Rao, M. Song, K. Mitsuishi, M. Takeguchi, and K. Furuya - Electric field influence on emission of characteristic X-ray from Al2O3 targets bombarded by slow Xe+ ions (156)

INTERNATIONAL REPORTS
Calendar of Meetings (158)
Short Courses & Workshops (160)
The International Centre for Diffraction Data hosts XRD Training for Pharmaceutical Scientists (162)

DENVER X-RAY CONFERENCE
D. Flaherty - 2005 Denver X-ray Conference (163)
Cumulative Author Index (185)