Powder Diffraction - Vol. 25 Number 2 - June 2010

Abstracts, Editorials, and International Reports from Powder Diffraction are now available online free of charge.  To view the abstracts with option to purchase articles or login if you have a subscription, please visit Cambridge Journals Online.  For information about subscribing please contact:

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EDITORIALS

  • Tom Blanton and George Havrilla - 58th Denver X-ray Conference and selected papers for the special June Powder Diffraction issue (89)
  • Ting C. Huang - Note from Editor-in-Chief (89)
  • Ting C. Huang - We welcome a new editor for calendar of meetings and workshops (90)
  • Winnie Wong-Ng - Farewell to Donald Petersen (April 14, 1929 to Feb 28, 2010) (91)

TECHNICAL ARTICLES

  • P. Zaumseil, A. Giussani, and T. Schroeder - Laboratory-based characterization of heteroepitaxial structures: Advanced experiments not needing synchrotron radiation (92)
  • J. Wittge, A. Danilewsky, D. Allen, P. McNally, Z. J. Li, T. Baumbach, E. Gorostegui-Colinas, J. Garagorri, M. R. Elizalde, D. Jacques, M. C. Fossati, D. K. Bowen, and B. K. Tanner - X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers (99)
  • Shigeo Sato, Yohei Takahashi, Kazuaki Wagatsuma, and Shigeru Suzuki - Characterization of aging behavior of precipitates and dislocations in copper-based alloys (104)
  • Conal E. Murray, A. J. Ying, S. M. Polvino, I. C. Noyan, and Z. Cai - Nanoscale strain characterization in microelectronic materials using X-ray diffraction (108)
  • Pedro Brito, Haroldo Pinto, Manuela Klaus, Christoph Genzel, and Anke Kaysser-Pyzalla - Internal stresses and textures of nanostructured alumina scales growing on polycrystalline Fe3Al alloy (114)
  • S. P. Farrell, L. W. MacGregor, and J. F. Porter - Stress analysis on Canadian naval platforms using a portable miniature X-ray diffractometer (119)
  • Z. Matěj, R. Kužel, and L. Nichtová - XRD total pattern fitting applied to study of microstructure of TiO2 films (125)
  • C. M. Hefferan, S. F. Li, J. Lind, and R. M. Suter - Tests of microstructure reconstruction by forward modeling of high energy X-ray diffraction microscopy data (132)
  • Dane V. Morgan, Mike Grover, Don Macy, Mike Madlener, Gerald Stevens, and William D. Turley - Observations of shock-loaded tin and zirconium surfaces with single-pulse X-ray diffraction (138)
  • Mark A. Rodriguez, Mark H. Van Benthem, David Ingersoll, Sven C. Vogel, and Helmut M. Reiche - In situ analysis of LiFePO4 batteries: Signal extraction by multivariate analysis (143)
  • Isaac Vander, R. W. Zuneska, and F. J. Cadieu - Thickness determination of SmCo films on silicon substrates utilizing X-ray diffraction (149)
  • Sterling Cornaby, Detlef-M. Smilgies, and Donald H. Bilderback - Bifocal miniature toroidal shaped X-ray mirrors (154)
  • P. Bruyndonckx, A. Sasov, and B. Pauwels - Towards sub-100-nm X-ray microscopy for tomographic applications (157)
  • A. Haibel, F. Beckmann, T. Dose, J. Herzen, M. Ogurreck, M. Müller, and A. Schreyer - Latest developments in microtomography and nanotomography at PETRA III (161)
  • B. Chyba, M. Mantler, and M. Reiter - Monte Carlo simulations for the evaluation of various influence factors on projections in computed tomography (165)
  • B. De Samber, S. Vanblaere, R. Evens, K. De Schamphelaere, G. Wellenreuther, F. Ridoutt, G. Silversmit, T. Schoonjans, B. Vekemans, B. Masschaele, L. Van Hoorebeke, K. Rickers, G. Falkenberg, I. Szaloki, C. Janssen, and L. Vincze - Dual detection X-ray fluorescence cryotomography and mapping on the model organism Daphnia magna (169)
  • Patrick J. Parsons and Kathryn G. McIntosh - Human exposure to lead and new evidence of adverse health effects: Implications for analytical measurements (175)
  • W. T. Elam, Bruce Scruggs, and Joseph Nicolosi - Combined multiple-excitation FP method for micro-XRF analysis of difficult samples (182)
  • David R. Black, Donald Windover, Albert Henins, David Gil, James Filliben, and James P. Cline - Certification of NIST Standard Reference Material 640d (187)

INTERNATIONAL REPORTS

  • 2010 ICDD Annual Spring Meetings (191)
  • Two-Dimensional X-ray Diffraction (200)
  • Calendar of Forthcoming Meetings (201)
  • Short Courses & Workshops (202)

DENVER X-RAY CONFERENCE

  • D. Flaherty - 2010 Denver X-ray Conference (202)
  • Cumulative Author Index (222)