Powder Diffraction - Vol. 28 Number 2 - June 2013

EDITORIAL

  • Tom Blanton, and George Havrilla - Sixty-first Denver X-ray Conference and selected papers for the special June Powder Diffraction issue (61)
  • Ting C. Huang - Most download AXA papers in 2012 (62)

TECHNICAL ARTICLES

  • R. Toro, J. Bruno-Colmenárez, G. Díaz de Delgado, and J.M. Delgado - Structural characterization of a new form of clenbuterol, a well-known decongestant and bronchodilator also used as a performance-enhancing drug (63)
  • Thomas N. Blanton, and Debasis Majumdar - Characterization of X-ray irradiated graphene oxide coatings using X-ray diffraction, X-ray photoelectron spectroscopy, and atomic force microscopy (68)
  • Rashmi Chourasia, and O.P. Shrivastava - Synthesis and crystallographic study of cation substituted NZP materials: Na1+xZr2−xMxP3O12 (M= Sb, Al, Cr and x = 0.1) (72)
  • R. Blondé, E. Jimenez-Melero, L. Zhao, J.P. Wright, E. Brück, S. van der Zwaag, and N.H. van Dijk - Multi length scale characterization of austenite in TRIP steels using high-energy X-ray diffraction (77)
  • Mark A. Rodriguez, Megan R. Pearl, Mark H. Van Benthem, James J. M. Griego, and Jamin R. Pillars - TILT-A-WHIRL: a texture analysis package for 3D rendering of pole figures using MATLAB (81)
  • Pierre Caussin - Comparing existing MAC tables – hints to possible developments (90)
  • B.K. Tanner, J. Wittge, P. Vagovič, T. Baumbach, D. Allen, P.J. McNally, R. Bytheway, D. Jacques, M.C. Fossati, D.K. Bowen, J. Garagorri, M.R. Elizalde, and A.N. Danilewsky - X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers (95)
  • Yoshikazu Fujii - Improvement of X-ray reflectivity calculations on a multilayered surface (100)
  • Krassimir Stoev, and Kenji Sakurai Quick - X-ray reflectivity of spherical samples (105)
  • Frank R. Feret - Selected applications of Rietveld-XRD analysis for raw materials of the aluminum industry (112)
    Takashi Ida, and Fujio Izumi - Analytical method for observed powder diffraction intensity data based on maximum likelihood estimation (124)
  • Christopher G. Worley, Lav Tandon, Patrick T. Martinez, and Diana L. Decker - Application of micro-XRF for nuclear materials characterization and problem solving (127)
  • Mitsuru Watanabe, Hisashi Inoue, Yasujiro Yamada, Michael Feeney, Laura Oelofse, and Yoshiyuki Kataoka - XRF analysis of high gain-on-ignition samples by fusion method using fundamental-parameter method (132)

INTERNATIONAL REPORTS

  • Lisa O'Neill - ICDD Annual Spring Meetings (137)

CALENDAR

  • Calendar of Forthcoming Meetings (149)
  • Calendar of Short Courses & Workshops (151)

2013 DXC Program

  • Denver X-ray Conference Program (152)

ERRATUM

  • Reference Materials for the Study of Polymorphism and Crystallinity in Cellulosics – ERRATUM (169)