Powder Diffraction - Vol. 6 Number 3 - September 1991

Abstracts, Editorials, and International Reports from Powder Diffraction are now available online free of charge.  To view the abstracts with option to purchase articles or login if you have a subscription, please visit Cambridge Journals Online.  For information about subscribing please contact:

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Contents:

  • D. P. LeGalley - A Type of Geiger-Mueller Counter Suitable for the Measurement of Diffracted Mo K X-rays (126)
  • H. Friedman - Geiger Counter Spectrometer for Industrial Research (130)
  • W. Parrish and S. Gordan - Precise Angular Control of Quartz-Cutting by X-rays (137)
  • L. Fengchao and Z. Bin - The Linear Coefficient of Thermal Expansion of Silicon at Room Temperature (147)
  • J. Fiala, V. Bodák, and M. Dubovinský - Powder Diffraction - A Journal Citation Study (153)
  • P. C. Burns, and F. C. Hawthorne - Rietveld Refinement of the Crystal Structure of CuF2 (156)
  • Z. Sperling - Permanent Samples for Guinier Cameras (159)
  • P. Eckerlin - The Absorption Correction of Debye-Scherrer Diagrams (161)
  • E. K. Vasil'ev et al. - Powder Diffraction Data for Nitroguanidine, C(NH2)2NNO2 (164)
  • B. Lundtoft and S. E. Rasmussen - X-ray Powder Diffraction Study of 2,2',2"-triamino-triethylamine-Ni(II)-di- thiocyanate by Transmission PSD Diffractometer and Rietveld Techniques (166))
  • N. Bukovec and P. Bukovec - X-ray Powder Data for Guanidinium Hexafluoro-chromate and -ferrate [C (NH2)3]3CrF6 and [C(NH2)3]3FeF6 (170)
  • Laboratory Note (172)
  • Dr. William Parrish Obituary (174)
  • International Report (176)
  • Calendar of Meetings (176)
  • Correspondent's Report (177)
  • Short Courses and Workshops (180)
  • Book Reviews (181)