The Powder Diffraction File™ has many tools useful for the analysis of electron diffraction data. These tools are described in this section. In general, electron diffraction has not been as accurate in the determination of d-spacings due to a number of physical constraints within conventional electron microscopes. However the loss of resolution and accuracy is usually compensated by the ability to focus on a few grains of material and the frequent use of accompanying elemental (EDS) data. As a result, while similarities exist, the methods and techniques of analysis using electron diffraction data are often different, yet complimentary. Due to its micro analytical capability electron diffraction has often been compared to the analysis of a tree, while bulk analysis by X-ray diffraction is compared to an analysis of the forest. The PDF-4™ databases can do spot, ring and EBSD pattern analyses.
Users' experimental spot pattern (white spots) and graphical overlay of ED simulation of phase match from PDF-4+ (red spots). (Each simulation is interactive allowing dynamic updates to patterns by simply adjusting parameters such as zone axes, camera length, and electron voltage.)
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