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NOTICE - This document includes dated information and numbers - NOTICE
PDF-4 SUPPORT SOFTWARE HIGHLIGHTS
ICDD's viewing softward is integrated into all PDF products. ICDD's viewing software provides more display, search, and data filtering capabilities for the PDF-4 format of the Powder Diffraction File. The program contains 53 different search methods to filter the database contents with custom display of a selection of 90 separate data fields. Using a Java™ point and click interface, various search methods and field selections can be combined to produce a nearly limitless choice of data mining options.
SIeve+ provides rapid searching and identification of materials using highly automated Hanawalt, Fink and Long-8 searches. While SIeve+ contains much of the functionality of ICDD’s printed Index and Search Manuals, its strengths take advantage of the dynamic computing power of modern PCs to rapidly perform permuted searches on hundreds of thousands of data entries.
An impressive list of new features and capabilities follows.
Capabilities
- Columns in all tables can be sorted, moved and resized by a mouse point and click
- Components inside windows are resizeable
- Search Tabs form can be undocked
- Displayed data can be copied onto the clipboard
- Estimated Standard Deviation (ESD) available for most numeric searches
- Multifunction search form
- Help files integrated with the PDF entry
- New Mineral subclasses: Non-ambient and Synthetic
- Electron Backscattering Pattern (prototype)
- Electron Diffraction Pattern (prototype)
- Bond distances/Angles display
PDF Entry Display
- View up to 3 tables of d-spacings and intensities with choices of fixed slit, variable slit and integrated intensities
- Use the undocking facility to move tables and compare them either nested or side by side
- 3 strongest spacings in bold
- Crystallographic data displayed in the “Structure” tab section of the PDF Card
- XML export revamped
Results Form Capabilities
- Directly add a selection of any of 70 fields from the Preferences menu option, sort, move and resize
- Open multiple PDF cards simultaneously with options to plot multiple digital patterns for custom selected groups
- Calculations for mean, median, and ESD
- Search parameters displayed on results form
- Middle mouse click on column header performs standard sort
- Middle mouse click on cell views data in a separate window
- Ability to add any field directly to results from the Preferences menu option
- Flexible formulae sorting in search results
- Search report options added in preferences: prompt for title, scale fields to fit page
Search Features
- Author and crystal cell searches now compliment reduced cell searches. Cell parameter and volumes may be searched within specified ranges or error limits (ESD's)
- On-the-fly conversion between author data and either crystal or reduced cell data
- Boolean operators can be mixed with Just/Only in Periodic Table search
- "Not" operator available for every search
- Search on any combination of L1, L2, and L3 for Long Line(s)
- Search on any combination of d1, d2, and d3 for Strong Line(s)
- Search on any combination of Dmeas, Dcalc, and Dstruc for Density
- Mix Boolean operators in the Periodic Table search
- Crystal Symmetry Allowed properties (i.e. Piezoelectric)
Search Preferences
- New fields can now be displayed for crystal, author and reduced cell parameters and unit cell volumes
- Search preferences—quick choice of existing sets on search results
Graphing Capabilities
- Add and delete patterns on-the-fly with the ability to individually tailor each pattern for instrument and specimen profile functions
- Particle Size profile function
- Debye-Scherrer geometry type
- 1/d x-axis units
- Graph can be panned when zoomed
- Advanced custom importing: - Save custom settings - 2-theta correction
- Apply wavelength
- Background
- Enhanced plot settings
- Change color of line
- Scale intensities to highest peak
SIeve+ 2011 - Purchase
SIeve+ provides rapid searching and identification of materials using highly automated Hanawalt, Fink and Long-8 searches. While SIeve+ contains much of the functionality of ICDD's printed Index and Search Manuals, its strengths take advantage of the dynamic computing power of modern PCs to rapidly perform permuted searches on hundreds of thousands of data entries. This enables Fink and Long-8 algorithms that are impractical with print, due to their enormous size with permutation. A new feature for this release is automatic rotation of the 3 strongest lines (Hanawalt) or the 8 longest of the strongest lines (Fink) or the 8 long lines (Long 8) to look for matches that exhibit the best Goodness of Match (GOM). Historically, these rotation operations were anticipated and integrated into paper manual search-index method protocols; they can be switched on/off in SIeve+ using the Preferences function. The paper manual search schema always offers a litmus test for searching, namely that all the lines in the unknown pattern must be matched against all the lines in the reference pattern(s). To address this comparison, we have implemented a “Pattern GOM” that provides this comparison. The SIeve+ display allows a comparison between the standard GOM and the Pattern GOM. Extensive digitized data plotting functions allow comparisons between experimental data and SIeve+ search match results.
SIeve+ works with either input d/I pairs or electronic files that contain d or two-theta/I data. A flexible text importer can read a wide variety of input files; any number of d/I pairs can be imported. SIeve+ is linked with Global searches and Search Preferences from our integrated software. This means that a user can custom define a SIeve+ input filter based on any of the 53 search method classes or combinations thereof. The results of SIeve+ can also be integrated into search criteria in our viewing software. SIeve+ is licensed as an activated plug-in to PDF-4+ for an additional cost and activates for a free 30-day trial period or until the product is registered.
Additional Features
- Phases displayed in a table with options for sorting
- Relative error shown on matching lines indicated in blue
- Selecting phases highlights corresponding matched lines
- Colors distinguish d-spacings that fall within a match window
- Sessions including examples are stored in XML files
- Units added to appropriate display fields: angstroms, degrees
- No limit on number of experiment lines
- No limit on number of phases
- Improved algorithms (speed and function)
- New rating: Pattern GOM
- I/Ic to matches and phases
- Advanced custom importing: Save custom settings
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