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M. Stanley Whittingham - ICDD Fellow

Stephen Hillier – ICDD’s 2020 Fellow

The International Centre for Diffraction Data (ICDD) is pleased to announce that Dr. M. Stanley Whittingham, of State University of New York at Binghamton, NY, USA, has been designated as an ICDD Fellow.

This award honors his pioneering efforts and distinguished contributions (task group and advisory) in areas of crystallography, powder patterns development, and pertinent crystal chemistry research of battery materials.

Learn more about the Fellow Award

March 25, 2021