12 Campus Blvd, Newtown Square, PA 19073, USA
(610) 325-9814
(610) 325-9823

Awards and Scholarships

As part of its philanthropic goals, the International Centre for Diffraction Data offers a number of awards, grants, and honors. Most of these awards are open to workers in the field of X-ray materials analysis. These documents describe each award and give information about the submission process as well as listing past award recipients.

Do you know someone who deserves one of these awards? Please follow specific award link for details on nominations.

Most Recent ICDD Award Recipients
Stephen Hillier
Stephen Hillier
Dr. James Kaduk
James Kaduk
Dr. Zavalij
Peter J. Zavalij
Award Winner
Leonid Vasylechko
Award Winner
I. Cev Noyan
Most Recent DXC Award Recipients
John Anselmo - Jenkins Award
John Anzelmo – 2019
Barrett Award
Peter Stephens (left) – 2019
Christina Streli (left) – 2018
Cohen Award Winner
Robert Free– 2019
Further information about the awards and the award process can be obtained from:

The Corporate Secretary
International Centre for Diffraction Data
12 Campus Boulevard
Newtown Square Corporate Campus
Newtown Square, PA 19073-3273 U.S.A.
Fax: 610.325.9823
Email: info@icdd.com