New Capabilities for 2022
To enhance the value of the PDF® Databases, ICDD has incorporated many new developments for the 2022 product release. Every year, we listen to our customers to create a better product for you. Below are just some of the many value-added developments designed to make the ICDD products more functional and powerful for 2022.
Enhanced User-Created Graphs
- Single or dual Y-axis plots
- Customize the size, shape, and color of graph data points for publication use
Importing Diffraction Data (SIeve+)
- New supported file types: Thermo-Fisher *.txl files (1D diffraction patterns)
- ESRF *.edf files: 2D diffraction patterns
- Enhance contrast of imported 2D images (*.jpg, *.png, *.tiff)
- Optimized importing files over a network
PDF-4 SAED Extension
- Import images and apply image processing options
- Simulation of freely rotatable SAED patterns from Structures
- Synchronized Structure Display and Stereographic Projection
- Searchable Reflection List with Absences
- Measurement Tools: Scalebar, Ruler, Protractor, Indexing Grid
- Measure Distances and Angles of clicked spots
Drop-Down Menu of Recent Search Input
- Easily re-populate search input from any past search using a new drop-down menu
- Save time by no longer having to re-enter search input
- Drop-down menu contains full search description and number of hits
Drop-Down Menu of Recent Search Results
- Quickly toggle between previous search results using a new drop-down menu
- Drop-down menu contains full search description and number of hits
Phase ID (SIeve+)
- Easily open previous SIeve+ session files and imported data files using new drop-down menu
- Drop-down menu displays a preview of the accepted phases and their wt%
- All SIeve+ sessions are supported
- X-ray diffraction analysis
- Neutron diffraction analysis
- Constant wavelength
- Time-of-flight
- Electron diffraction analysis
- 1D and 2D diffraction patterns
- Dynamically change simulation settings in the Adjust Phases window
- Lock the wt% of a specific phase (as an internal standard) for RIR analysis
- Using standard addition or XRF data
- Unknown/amorphous wt% will be calculated and displayed
- User-modified values are highlighted in red
- Reset button allows the user to reset all changes
