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ICDD’s Rietveld Refinement & Indexing Workshop

Powder pattern Indexing and Rietveld structural refinement techniques are complementary and are often used to completely describe the structure of a material. Successful indexing of a powder pattern is considered strong evidence for phase purity. Let our team of experts help…

Ludo Frevel Deadline

The applicant should be a graduate student enrolled in a graduate degree program  during the 2019 calendar year, with major interest in the following: crystallography e.g. crystal structure analysis crystal morphology modulated structures correlation of atomic structure with physical properties systematic…


GSA – The Geological Society of America 130th Annual Meeting Visit Justin Blanton and Helen McDonnell at Booth 716 and learn how the 2019 Powder Diffraction File™ can solve your material problems. 4 – 7 November 2018 Indiana Convention Center Indianapolis,…

MS&T – Materials Science & Technology

MS&T – Materials Science & Technology Visit Justin Blanton and Benjamin Hish at Booth 425 and learn about the new capabilities of the 2019 Powder Diffraction File™. 14 – 18 October 2018 Greater Columbus Convention Center Columbus, Ohio, USA


SARX – Latin American Seminar of Analysis by X-ray Techniques Attend the Workshop: CHEMFORS: The Characterization of Cultural and Forensic Materials using X-Ray Techniques with Miguel Delgado, Universidad de Los Andes and Tom Blanton, ICDD. 4 – 9 November 2018 Universidad…

ICDD at MRS Fall

MRS Fall – Materials Research Society Fall Meeting Visit Helen McDonnell and Benjamin Hish at Booth 418 and learn about the new capabilities of the 2019 Powder Diffraction File™. 25 – 30 November 2018 Hynes Convention Center Boston, Massachusetts, USA See…


SAVE THE DATE 9- 12 May 2019 in Switzerland PPXRD-16 will be a joint meeting with the 2nd Spring Pharmaceutical Synchrotron X-ray Powder Diffraction Workshop (SPS-XRPD). Learn More Here

Advances in X-ray Analysis

Hosted annually, the Denver X-ray Conference (DXC) is the world’s leading forum for scientists working in the field of X-ray materials analysis. Presenters are encouraged to submit manuscripts of the work presented at the conference for publication in the latest volume…

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